Calibration standard for high-resolution X-ray diffraction

Description

• General description: This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with International System of Units (SI) [1] traceable Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection for our reference wavelength. A unit of SRM 2000 consists of25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.SRM 2000_certSRM 2000_SDS
• Other Notes: Please download a current certificate at nist.gov/SRM for current analytes and certified values.
• Legal Information: NIST is a registered trademark of National Institute of Standards and Technology