Line Position And Line Shape Standard for Powder Diffraction

Description

• General description: The Standard Reference Material (SRM) was prepared from ultra-high purity, intrinsic silicon boules that were crushed and jet milled to a median particle size of 4.1μm. The resulting powder was then annealed under gettered argon at 1000 °C for two hours and bottled under argon.SRM 640F_Cert SRM 640F_SDS
• Application: This SRM is intended for use as a standard for calibration of diffraction line positions and line shapes, determined through powder diffractometry.
• Features and Benefits: A unit of SRM 640f consists of approximately 7.5 g of silicon powder bottled under argon.Analysis of X-ray powder diffraction data indicated that the SRM material is homogeneous with respect to diffraction properties.SRM 640f was bottled under argon to protect against humidity.The certification data was analyzed using the FPA method with Pawley refinements as implemented in TOPAS.Expiration details and storage instructions are available in the NIST certificate.
• Other Notes: Please download a current certificate at nist.gov/SRM for current analytes and certified values.
• Legal Information: NIST is a registered trademark of National Institute of Standards and Technology