455199

Tetrakis(dimethylamido)hafnium(IV)

≥99.99%

Manufacturer: Sigma Aldrich

CAS Number: 19782-68-4

Synonym(S): TDMAH, Tetrakis(dimethylamino)hafnium(IV)

Select a Size

Pack Size SKU Availability Price
25 G 455199-25-G In Stock ₹ 94,891.95

455199 - 25 G

₹ 94,891.95

In Stock

Quantity

1

Base Price: ₹ 94,891.95

GST (18%): ₹ 17,080.551

Total Price: ₹ 1,11,972.501

Quality Level

100

Assay

≥99.99%

form

low-melting solid

reaction suitability

core: hafnium

mp

26-29 °C (lit.)

density

1.098 g/mL at 25 °C

SMILES string

CN(C)[Hf](N(C)C)(N(C)C)N(C)C

InChI

1S/4C2H6N.Hf/c4*1-3-2;/h4*1-2H3;/q4*-1;+4

InChI key

ZYLGGWPMIDHSEZ-UHFFFAOYSA-N

Other Options

Image Product Name Manufacturer Price Range
50-201-6677
Strem, An Ascensus Company CAS# 19782-68-4. 1g. Tetrakis(dimethylamino)hafnium, 98+% (99.99+%-Hf, <0.2% Zr) TDMAH, PURATREM. MFCD01862473
Strem, An Ascensus Company ₹ 13,963.39
666610
Tetrakis(dimethylamido)hafnium(IV)
Sigma Aldrich ₹ 1,40,876.55
AR002CYE
Methanamine, N-methyl-, hafnium(4+) salt (4:1)
Aaron Chemicals LLC --
AB09002
19782-68-4 | Methanamine, N-methyl-, hafnium(4+) salt (4:1)
A2B Chem ₹ 15,315.24 - ₹ 99,249.60

Related Products

Img

Sigma Aldrich

666610

packaged for use in deposition syst...

Img

Sigma Aldrich

455202

99.99%...

Img

Sigma Aldrich

669016

packaged for use in deposition syst...

Img

Sigma Aldrich

469858

99.999% trace metals basis...

Img

Sigma Aldrich

579211

electronic grade, ≥99.99% trace met...

Img

Sigma Aldrich

669008

packaged for use in deposition syst...

Img

Sigma Aldrich

698431

99.9% trace metals basis...

Img

Sigma Aldrich

725544

packaged for use in deposition syst...

Description

  • General description: Tetrakis(dimethylamido)hafnium(IV) is an organometallic compound consisting of a central hafnium atom (Hf) surrounded by four dimethylamido ligands (NMe2). It is commonly used as a CVD/ALD precursor to produce high-quality Hf thin films. It is a solid with low melting point.
  • Application: Tetrakis(dimethylamido)hafnium(IV) can be used:As an atomic layer deposition(ALD) precursor for deposition of hafnium oxide thin films for advanced semiconductor devices.[1]As a precursor to fabricate polymer-derived ceramic nanocomposites.[2]To prepare HfO2, CeO2, and Ce-doped HfO2 thin films on Ge substrates by using tris(isopropyl-cyclopentadienyl)cerium [Ce(iPrCp)3] precursors with H2O via ALD method.[3]To produce Hf3N4 thin films with TDMAH and ammonia at low substrate temperatures at 150−250 °C.[4]
  • Analysis Note: Purity excludes ~2000 ppm Zr.

SAFETY INFORMATION

Pictograms

GHS02,GHS05

Signal Word

Danger

Hazard Statements

H228,H261,H314

Precautionary Statements

P210 - P231 + P232 - P280 - P305 + P351 + P338 - P310 - P422

Hazard Classifications

Flam. Sol. 1 - Skin Corr. 1B - Water-react 2

Supplementary Hazards

EUH014

WGK

WGK 3

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

Compare Similar Items

Show Difference

Img

Sigma Aldrich

455199

≥99.99%...


Quality Level:
100

Assay:
≥99.99%

form:
low-melting solid

reaction suitability:
core: hafnium

mp:
26-29 °C (lit.)

density:
1.098 g/mL at 25 °C

SMILES string:
CN(C)[Hf](N(C)C)(N(C)C)N(C)C

InChI:
1S/4C2H6N.Hf/c4*1-3-2;/h4*1-2H3;/q4*-1;+4

InChI key:
ZYLGGWPMIDHSEZ-UHFFFAOYSA-N

Img

Sigma Aldrich

455202

99.99%...


Quality Level:
100

Assay:
99.99%

form:
liquid

reaction suitability:
core: hafnium

mp:
__

density:
1.249 g/mL at 25 °C (lit.)

SMILES string:
CCN(CC)[Hf](N(CC)CC)(N(CC)CC)N(CC)CC

InChI:
1S/4C4H10N.Hf/c4*1-3-5-4-2;/h4*3-4H2,1-2H3;/q4*-1;+4

InChI key:
VBCSQFQVDXIOJL-UHFFFAOYSA-N

Img

Fischer Scientific

4552284

Ensure accurate, reproducible resul...


Quality Level:
__

Assay:
__

form:
__

reaction suitability:
__

mp:
__

density:
__

SMILES string:
__

InChI:
__

InChI key:
__

Img

Fischer Scientific

4552285

Employ one marker in a comprehensiv...


Quality Level:
__

Assay:
__

form:
__

reaction suitability:
__

mp:
__

density:
__

SMILES string:
__

InChI:
__

InChI key:
__