Motic™ Panthera TEC Material Upright Trinocular Microscope

Description

• The Panthera TEC is clearly focused on material sciences, filling the last gap in the Panthera family
• Brightfield, Darkfield and simple Polarization contrast combined with a new segmental illumination allows for an oblique incident illumination, perfect for detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample
• LD Plan BD objectives with a high imaging performance, mounted on 5-fold encoded nosepiece Light intensity for each objective position is automatically memorized and will be repeated once the objective is swung in again Compact Epi illuminator carries a slot for polarizer and analyzer, ready for Polarization contrast and reducing internal reflections Illuminator also includes controls for varying incident light in terms of mode (BF or DF) and illumination angle Extended Field of View offers 21% more visual area in comparison to basic 20 mm FOV system Beam split (25° viewing angle) is fixed by 50/50 (vis/photo) Incident illumination is performed by a 3W LED of selectable color temperature Incident/transmitted stand type for compound materials additionally carries transmitted LED illumination system with 39 LEDs mounted in an LED condenser (here, a stage with glass insert will be applied)