14-385-500LY
Thermo Scientific™ Evolution™ One UV-Vis Spectrophotometer, Trade-up Promotion
Manufacturer: Thermo Scientific™
Select a Size
| Pack Size | SKU | Availability | Price |
|---|---|---|---|
| Each of 1 | 14-385-500LY-Each-of-1 | In Stock | ₹ 6,84,480.00 |
14-385-500LY - Each of 1
In Stock
Quantity
1
Base Price: ₹ 6,84,480.00
GST (18%): ₹ 1,23,206.40
Total Price: ₹ 8,07,686.40
Baseline Flatness
±0.001 A, 200–800 nm, 1.0 nm SBW, smoothed
Detector Type
Silicon Photodiode
Light Source
Pulsed Xenon
Spectral Bandwidth
1 nm
Wavelength Range
190 to 1100 nm
Electrical Requirements
100/240 V, 50/60 Hz selected automatically, 150 W maximum
Noise
≤0.00015 A at 0 A, ≤0.00025 A at 1 A, ≤0.00050 A at 2 A, 260 nm, 1.0 nm SBW, RMS
Pharmacopoeia Compliance Testing
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010 A; Stray Light: ≤1% T at 198 nm: KCI; ≤0.05% AT at 220 nm: Nal, Kl; Wavelength Accuracy: ±.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range; Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display
-0.3 to 4.0 A
Photometric Repeatability
1 A: ±0.0002 A
Scan Speed
<1 to 6000 nm/min. (Variable)
Wattage
150 W max.
Wavelength Data Interval
10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Weight (English)
32 lb.
Description
Evolution One UV-Vis Spectrophotometer
Dimensions (L x W x H)
593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)
Product Line
Evolution One
Type
UV-Vis Spectrophotometer
Drift
<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Lamp Life
>5 years or longer if not using live signal
Optical Design
Double-beam with sample and reference cuvette positions Czerny-Turner Monochromator
Photometric Accuracy
1 A: ±0.004 A, 2 A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range
>3.5 A
Scan Ordinate Modes
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Warranty
Instrument (2 years), Lamp (3 years)
Wavelength Accuracy
±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Repeatability
≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric)
14.5 kg
Related Products
Description
- For routine to research analysis, this instrument series offers real innovations that provide enhanced usability and performance - without added complexity
- With straightforward software, cutting-edge instrumentation and a wide selection of accessories, the Evolution One and One Plus UV-Vis Spectrophotometers work with you to perform experiments the way you want - for the results you need
- Optimized Engineering Delivers Ultimate Performance: Double-beam geometry with fixed 1 nm or variable spectral bandwidth options Application Focused Beam Geometry (AFBG) technology enables the best performance from microcells, solid samples, and fiber optic probes (Evolution One Plus Only) Xenon flash lamp requires no warm-up time allowing instant measurements Meet chemical, materials science, or biological sampling and measurement needs with a broad range of accessories Insight Pro Software—Easy-to-learn, easy-to-use Reduce training time: Optimized user interface with prompting software defines clear step-by-step workflow and is easy to teach and learn Prevent costly sampling and measurement errors: Create dedicated workflows for complex assay and transform multi-step workflows into one simplified, easy-to-follow method suitable for any level of user with Customized User Environment (CUE) Always current: Whether it is user inputs or application requirements, or new regulations, Insight Pro Software is continuously improving with quick upgrades to deliver greater capabilities and efficiencies for your lab’s needs Accessories for all your Sampling Needs: Wide accessory selection with various temperature control options, sample changers, sippers and solid sampling devices complete your analysis Choice of Peltier Single Cell Holder or a Smart 8-Cell Peltier system for temperature control and sample monitoring from 0° to 100 °C Easy software integration gives you complete control of your measurements Regulatory/Quality Control Environments: To use the EvolutionOne/One Plus UV-Vis Spectrophotometers in a regulated or quality control environment, we offer a wide selection of compliance products and services to reduce implementation time and assure system performance
- Evolution One/One Plus Security and Validator Bundles include: Evolution One or One Plus UV-Vis Spectrometer INSIGHT Pro with Security Software Validator for Insight Pro US Ltr or INTL A4 Paper Version Qualification Filter Kit for UV-Vis Evolution One/One Plus USP/EP Standards Pharma Bundles include: Evolution One or One Plus Spectrometer INSIGHT Pro with Security Software Validator for Insight Pro US Ltr or INTL A4 Paper Version USP and EP UV Standards Set USP and EP Visible Standards Set
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Baseline Flatness: ±0.001 A, 200–800 nm, 1.0 nm SBW, smoothed
Detector Type: Silicon Photodiode
Light Source: Pulsed Xenon
Spectral Bandwidth: 1 nm
Wavelength Range: 190 to 1100 nm
Electrical Requirements: 100/240 V, 50/60 Hz selected automatically, 150 W maximum
Noise: ≤0.00015 A at 0 A, ≤0.00025 A at 1 A, ≤0.00050 A at 2 A, 260 nm, 1.0 nm SBW, RMS
Pharmacopoeia Compliance Testing: Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010 A; Stray Light: ≤1% T at 198 nm: KCI; ≤0.05% AT at 220 nm: Nal, Kl; Wavelength Accuracy: ±.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range; Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display: -0.3 to 4.0 A
Photometric Repeatability: 1 A: ±0.0002 A
Scan Speed: <1 to 6000 nm/min. (Variable)
Wattage: 150 W max.
Wavelength Data Interval: 10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Weight (English): 32 lb.
Description: Evolution One UV-Vis Spectrophotometer
Dimensions (L x W x H): 593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)
Product Line: Evolution One
Type: UV-Vis Spectrophotometer
Drift: <0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Lamp Life: >5 years or longer if not using live signal
Optical Design: Double-beam with sample and reference cuvette positions Czerny-Turner Monochromator
Photometric Accuracy: 1 A: ±0.004 A, 2 A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range: >3.5 A
Scan Ordinate Modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Warranty: Instrument (2 years), Lamp (3 years)
Wavelength Accuracy: ±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Repeatability: ≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric): 14.5 kg
Baseline Flatness:
±0.001 A, 200–800 nm, 1.0 nm SBW, smoothed
Detector Type:
Silicon Photodiode
Light Source:
Pulsed Xenon
Spectral Bandwidth:
1 nm
Wavelength Range:
190 to 1100 nm
Electrical Requirements:
100/240 V, 50/60 Hz selected automatically, 150 W maximum
Noise:
≤0.00015 A at 0 A, ≤0.00025 A at 1 A, ≤0.00050 A at 2 A, 260 nm, 1.0 nm SBW, RMS
Pharmacopoeia Compliance Testing:
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010 A; Stray Light: ≤1% T at 198 nm: KCI; ≤0.05% AT at 220 nm: Nal, Kl; Wavelength Accuracy: ±.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range; Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display:
-0.3 to 4.0 A
Photometric Repeatability:
1 A: ±0.0002 A
Scan Speed:
<1 to 6000 nm/min. (Variable)
Wattage:
150 W max.
Wavelength Data Interval:
10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Weight (English):
32 lb.
Description:
Evolution One UV-Vis Spectrophotometer
Dimensions (L x W x H):
593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)
Product Line:
Evolution One
Type:
UV-Vis Spectrophotometer
Drift:
<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hr. warmup
Lamp Life:
>5 years or longer if not using live signal
Optical Design:
Double-beam with sample and reference cuvette positions Czerny-Turner Monochromator
Photometric Accuracy:
1 A: ±0.004 A, 2 A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range:
>3.5 A
Scan Ordinate Modes:
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Warranty:
Instrument (2 years), Lamp (3 years)
Wavelength Accuracy:
±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Repeatability:
≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric):
14.5 kg
Baseline Flatness: ±0.001 A, 200 to 800 nm, 1.0 nm SBW, smoothed
Detector Type: Dual Silicon Photodiodes
Light Source: Xenon Flash Lamp (>5 years typical, 3 years guaranteed)
Spectral Bandwidth: Variable: 1 nm; 2 nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
Wavelength Range: 190 to 1100 nm
Electrical Requirements: 100 to 240 V; 50 to 60 Hz, selected automatically, 150 W max.
Noise: 0A: ≤0.00015 A; 1A: ≤0.00025 A; 2A: ≤0.00050 A; 260 nm, 1.0 nm SBW, RMS
Pharmacopoeia Compliance Testing: Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010 A; Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl; Wavelength Accuracy: ±.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range; Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display: -0.3 to 4.0 A
Photometric Repeatability: 1 A: ±0.0002 A
Scan Speed: <1 to 6000 nm/min, variable
Wattage: 150 W max.
Wavelength Data Interval: __
Weight (English): 32 lb.
Description: Evolution One Plus UV-Vis Spectrophotometer
Dimensions (L x W x H): 593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)
Product Line: __
Type: __
Drift: <0.0005 A/hr; 500 nm, 1.0 nm SBW, 1 hour warm-up
Lamp Life: __
Optical Design: Double beam with sample and reference cuvette positions Czerny-Turner Monochromator; Application Focused Beam Geometry; Czerny-Turner Monochromator
Photometric Accuracy: __
Photometric Range: >3.5 A
Scan Ordinate Modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs Factor, Intensity
Warranty: __
Wavelength Accuracy: ±0.5 nm (541.9, 546.1 nm mercury lines); ±0.8 nm (full range 190 to 1100 nm)
Wavelength Repeatability: ≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric): 14.5 kg
Baseline Flatness:
±0.001 A, 200 to 800 nm, 1.0 nm SBW, smoothed
Detector Type:
Dual Silicon Photodiodes
Light Source:
Xenon Flash Lamp (>5 years typical, 3 years guaranteed)
Spectral Bandwidth:
Variable: 1 nm; 2 nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
Wavelength Range:
190 to 1100 nm
Electrical Requirements:
100 to 240 V; 50 to 60 Hz, selected automatically, 150 W max.
Noise:
0A: ≤0.00015 A; 1A: ≤0.00025 A; 2A: ≤0.00050 A; 260 nm, 1.0 nm SBW, RMS
Pharmacopoeia Compliance Testing:
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010 A; Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl; Wavelength Accuracy: ±.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range; Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Display:
-0.3 to 4.0 A
Photometric Repeatability:
1 A: ±0.0002 A
Scan Speed:
<1 to 6000 nm/min, variable
Wattage:
150 W max.
Wavelength Data Interval:
__
Weight (English):
32 lb.
Description:
Evolution One Plus UV-Vis Spectrophotometer
Dimensions (L x W x H):
593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)
Product Line:
__
Type:
__
Drift:
<0.0005 A/hr; 500 nm, 1.0 nm SBW, 1 hour warm-up
Lamp Life:
__
Optical Design:
Double beam with sample and reference cuvette positions Czerny-Turner Monochromator; Application Focused Beam Geometry; Czerny-Turner Monochromator
Photometric Accuracy:
__
Photometric Range:
>3.5 A
Scan Ordinate Modes:
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs Factor, Intensity
Warranty:
__
Wavelength Accuracy:
±0.5 nm (541.9, 546.1 nm mercury lines); ±0.8 nm (full range 190 to 1100 nm)
Wavelength Repeatability:
≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Weight (Metric):
14.5 kg
Baseline Flatness: ±0.001 A (200 to 800 nm), 2.0 nm SBW, smoothed
Detector Type: Silicon Photodiode
Light Source: Pulsed Xenon
Spectral Bandwidth: __
Wavelength Range: 190 to 1100 nm
Electrical Requirements: 100/240 V, 50/60 Hz
Noise: <0.00018 A at 0 A; <0.00022 A at 1 A; <0.00050 A at 2 A, 500 nm, 2.0 nm SBW, RMS
Pharmacopoeia Compliance Testing: Wavelength Accuracy: ±0.3 nm 190–900 nm; Wavelength Repeatability: SD 10 meas. <0.1 nm; Absorbance Accuracy: <±0.010 A at 1 A, <±0.010 A at 2 A; Absorbance Repeatability: ±0.0025 A @ 1 A
Photometric Display: ±6 A
Photometric Repeatability: 1 A: ±0.0025 A
Scan Speed: Variable, up to 6000 nm/min.
Wattage: __
Wavelength Data Interval: 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Weight (English): __
Description: Evolution Pro UV-Vis Spectrophotometer
Dimensions (L x W x H): __
Product Line: __
Type: UV-Vis Spectrophotometer
Drift: <0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Lamp Life: >5 years or longer if not using live signal
Optical Design: Modified Ebert, Double beam with sample and reference cuvette/accessory positions
Photometric Accuracy: 1 A: ±0.004 A,2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range: >4 A
Scan Ordinate Modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Warranty: 3-year Source Replacement Warranty
Wavelength Accuracy: ±0.20 nm (546.07 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Repeatability: Standard deviation of 10 measurements <0.05 nm
Weight (Metric): __
Baseline Flatness:
±0.001 A (200 to 800 nm), 2.0 nm SBW, smoothed
Detector Type:
Silicon Photodiode
Light Source:
Pulsed Xenon
Spectral Bandwidth:
__
Wavelength Range:
190 to 1100 nm
Electrical Requirements:
100/240 V, 50/60 Hz
Noise:
<0.00018 A at 0 A; <0.00022 A at 1 A; <0.00050 A at 2 A, 500 nm, 2.0 nm SBW, RMS
Pharmacopoeia Compliance Testing:
Wavelength Accuracy: ±0.3 nm 190–900 nm; Wavelength Repeatability: SD 10 meas. <0.1 nm; Absorbance Accuracy: <±0.010 A at 1 A, <±0.010 A at 2 A; Absorbance Repeatability: ±0.0025 A @ 1 A
Photometric Display:
±6 A
Photometric Repeatability:
1 A: ±0.0025 A
Scan Speed:
Variable, up to 6000 nm/min.
Wattage:
__
Wavelength Data Interval:
10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Weight (English):
__
Description:
Evolution Pro UV-Vis Spectrophotometer
Dimensions (L x W x H):
__
Product Line:
__
Type:
UV-Vis Spectrophotometer
Drift:
<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Lamp Life:
>5 years or longer if not using live signal
Optical Design:
Modified Ebert, Double beam with sample and reference cuvette/accessory positions
Photometric Accuracy:
1 A: ±0.004 A,2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range:
>4 A
Scan Ordinate Modes:
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Warranty:
3-year Source Replacement Warranty
Wavelength Accuracy:
±0.20 nm (546.07 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Repeatability:
Standard deviation of 10 measurements <0.05 nm
Weight (Metric):
__
Baseline Flatness: __
Detector Type: __
Light Source: __
Spectral Bandwidth: __
Wavelength Range: __
Electrical Requirements: __
Noise: __
Pharmacopoeia Compliance Testing: __
Photometric Display: __
Photometric Repeatability: __
Scan Speed: __
Wattage: __
Wavelength Data Interval: __
Weight (English): __
Description: __
Dimensions (L x W x H): __
Product Line: __
Type: Cell Holder
Drift: __
Lamp Life: __
Optical Design: __
Photometric Accuracy: __
Photometric Range: __
Scan Ordinate Modes: __
Warranty: __
Wavelength Accuracy: __
Wavelength Repeatability: __
Weight (Metric): __
Baseline Flatness:
__
Detector Type:
__
Light Source:
__
Spectral Bandwidth:
__
Wavelength Range:
__
Electrical Requirements:
__
Noise:
__
Pharmacopoeia Compliance Testing:
__
Photometric Display:
__
Photometric Repeatability:
__
Scan Speed:
__
Wattage:
__
Wavelength Data Interval:
__
Weight (English):
__
Description:
__
Dimensions (L x W x H):
__
Product Line:
__
Type:
Cell Holder
Drift:
__
Lamp Life:
__
Optical Design:
__
Photometric Accuracy:
__
Photometric Range:
__
Scan Ordinate Modes:
__
Warranty:
__
Wavelength Accuracy:
__
Wavelength Repeatability:
__
Weight (Metric):
__