14-385-506LY
Thermo Scientific™ Evolution™ Pro UV-Vis Spectrophotometer, Trade-up Promotion
Manufacturer: Thermo Scientific™
Select a Size
| Pack Size | SKU | Availability | Price |
|---|---|---|---|
| Each of 1 | 14-385-506LY-Each-of-1 | In Stock | ₹ 11,14,280.00 |
14-385-506LY - Each of 1
In Stock
Quantity
1
Base Price: ₹ 11,14,280.00
GST (18%): ₹ 2,00,570.40
Total Price: ₹ 13,14,850.40
Baseline Flatness
±0.001 A (200 to 800 nm), 2.0 nm SBW, smoothed
Detector Type
Silicon Photodiode
Type
UV-Vis Spectrophotometer
Drift
<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
For Use With (Application)
Academic, Chemicals, Food and Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Noise
<0.00018 A at 0 A; <0.00022 A at 1 A; <0.00050 A at 2 A, 500 nm, 2.0 nm SBW, RMS
Pharmacopoeia Compliance Testing
Wavelength Accuracy: ±0.3 nm 190–900 nm; Wavelength Repeatability: SD 10 meas. <0.1 nm; Absorbance Accuracy: <±0.010 A at 1 A, <±0.010 A at 2 A; Absorbance Repeatability: ±0.0025 A @ 1 A
Photometric Display
±6 A
Photometric Repeatability
1 A: ±0.0025 A
Scan Speed
Variable, up to 6000 nm/min.
Warranty
3-year Source Replacement Warranty
Wavelength Data Interval
10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Description
Evolution Pro UV-Vis Spectrophotometer
Light Source
Pulsed Xenon
Wavelength Range
190 to 1100 nm
Electrical Requirements
100/240 V, 50/60 Hz
Lamp Life
>5 years or longer if not using live signal
Optical Design
Modified Ebert, Double beam with sample and reference cuvette/accessory positions
Photometric Accuracy
1 A: ±0.004 A,2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range
>4 A
Scan Ordinate Modes
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Stray Light
KCl, 198 nm: ≤0.4% T; NaI, 220 nm: ≤0.032% T; NaNO2, 340 nm: <0.01% T
Wavelength Accuracy
±0.20 nm (546.07 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Repeatability
Standard deviation of 10 measurements <0.05 nm
Related Products
Description
- Applications: Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals Evolution Pro UV-Vis Spectrophotometers: Rely on the double beam optical design providing outstanding reliability, precision performance, and long-term stability for the most demanding applications
- Optimized performance for advanced testing requirements and peak resolution capabilities with selectable bandwidths of 0.5, 1.0, 1.5, 2.0 and 4.0 nm
- Ensure accuracy of your data with optional Calibration Validation Carousel (CVC) for automated performance verification
- Get instant measurements and excellent performance over entire wavelength range of 190-1100 nm with xenon flash lamp
- Move from samples to answer faster: Easily go from sample to final report - with intuitive INSIGHT Pro Software guiding you every step of the way
- Obtain results you need for quantitative analysis, scanning and kinetics applications with comprehensive software tools for data collection, processing, and reporting
- Customize even complex methods with ease using workflow-oriented application modules
- Enforce data security with optional INSIGHT Pro Security Software tools to assist with achieving current 21 CFR Part 11 compliance in your pharmaceutical lab
- Enhance productivity with sampling flexibility: Speed up your analysis with Thermo Scientific™ Smart Accessories with snap-in design for convenience and consistency
- Eliminate manual setup with auto-recognition and software integration of sippers, cells changers, and auto-sampler accessories
- Take advantage of the Evolution Pro UV-Vis Spectrophotometer’s wide beam separation and large sample compartment, providing flexibility for unique accessories and advanced applications
- Regulatory/Quality Control Environments: To use the Evolution Pro UV-Vis Spectrophotometer in a regulated or quality control environment, we offer a wide selection of compliance products and services to reduce implementation time and assure system performance
- Evolution Pro Pharma Value Bundles include: Evolution Pro Spectrometer INSIGHT Pro with Security Software Validator for Insight Pro US Ltr or INTL A4 Paper Version Qualification Filter Kit for UV-Vis Evolution Pro USP/EP Standards Pharma Bundles include: Evolution Pro Spectrometer INSIGHT Pro with Security Software Validator for Insight Pro US Ltr or INTL A4 Paper Version USP and EP UV Standards Set USP and EP Visible Standards Set Accessory Ordering Information: All accessories are sold separately
- Other accessories include cell changers, cuvette and test holders, calibration carousels, sippers, fiber optic probes, small volume sampling, and accessories for reflectance and rapid mixing.
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Baseline Flatness: ±0.001 A (200 to 800 nm), 2.0 nm SBW, smoothed
Detector Type: Silicon Photodiode
Type: UV-Vis Spectrophotometer
Drift: <0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
For Use With (Application): Academic, Chemicals, Food and Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Noise: <0.00018 A at 0 A; <0.00022 A at 1 A; <0.00050 A at 2 A, 500 nm, 2.0 nm SBW, RMS
Pharmacopoeia Compliance Testing: Wavelength Accuracy: ±0.3 nm 190–900 nm; Wavelength Repeatability: SD 10 meas. <0.1 nm; Absorbance Accuracy: <±0.010 A at 1 A, <±0.010 A at 2 A; Absorbance Repeatability: ±0.0025 A @ 1 A
Photometric Display: ±6 A
Photometric Repeatability: 1 A: ±0.0025 A
Scan Speed: Variable, up to 6000 nm/min.
Warranty: 3-year Source Replacement Warranty
Wavelength Data Interval: 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Description: Evolution Pro UV-Vis Spectrophotometer
Light Source: Pulsed Xenon
Wavelength Range: 190 to 1100 nm
Electrical Requirements: 100/240 V, 50/60 Hz
Lamp Life: >5 years or longer if not using live signal
Optical Design: Modified Ebert, Double beam with sample and reference cuvette/accessory positions
Photometric Accuracy: 1 A: ±0.004 A,2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range: >4 A
Scan Ordinate Modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Stray Light: KCl, 198 nm: ≤0.4% T; NaI, 220 nm: ≤0.032% T; NaNO2, 340 nm: <0.01% T
Wavelength Accuracy: ±0.20 nm (546.07 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Repeatability: Standard deviation of 10 measurements <0.05 nm
Baseline Flatness:
±0.001 A (200 to 800 nm), 2.0 nm SBW, smoothed
Detector Type:
Silicon Photodiode
Type:
UV-Vis Spectrophotometer
Drift:
<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
For Use With (Application):
Academic, Chemicals, Food and Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Noise:
<0.00018 A at 0 A; <0.00022 A at 1 A; <0.00050 A at 2 A, 500 nm, 2.0 nm SBW, RMS
Pharmacopoeia Compliance Testing:
Wavelength Accuracy: ±0.3 nm 190–900 nm; Wavelength Repeatability: SD 10 meas. <0.1 nm; Absorbance Accuracy: <±0.010 A at 1 A, <±0.010 A at 2 A; Absorbance Repeatability: ±0.0025 A @ 1 A
Photometric Display:
±6 A
Photometric Repeatability:
1 A: ±0.0025 A
Scan Speed:
Variable, up to 6000 nm/min.
Warranty:
3-year Source Replacement Warranty
Wavelength Data Interval:
10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Description:
Evolution Pro UV-Vis Spectrophotometer
Light Source:
Pulsed Xenon
Wavelength Range:
190 to 1100 nm
Electrical Requirements:
100/240 V, 50/60 Hz
Lamp Life:
>5 years or longer if not using live signal
Optical Design:
Modified Ebert, Double beam with sample and reference cuvette/accessory positions
Photometric Accuracy:
1 A: ±0.004 A,2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 440 nm using neutral density filters traceable to NIST
Photometric Range:
>4 A
Scan Ordinate Modes:
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative
Stray Light:
KCl, 198 nm: ≤0.4% T; NaI, 220 nm: ≤0.032% T; NaNO2, 340 nm: <0.01% T
Wavelength Accuracy:
±0.20 nm (546.07 nm Hg emission line), ±0.30 nm, 190 to 900 nm
Wavelength Repeatability:
Standard deviation of 10 measurements <0.05 nm
Baseline Flatness: __
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Wavelength Data Interval:
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